J. M. Dienot and G. , Experimental study of thermal influence on EMC emission of digital circuit on PCB, Proceedings of the 16th International Symposium on Electromagnetic Compatibility, pp.299-302, 2005.

S. B. Dhia, E. Sicard, A. Boyer, Y. Mequignon, and J. M. Dienot, Thermal Influence on 16-Bits Microcontroller Emission, 2007 IEEE International Symposium on Electromagnetic Compatibility, 2007.
DOI : 10.1109/ISEMC.2007.158

J. M. Dienot, Characterization and simulation of digital device electromagnetic noise under non-ambient temperature conditions, Electronics Letters, vol.43, issue.20, 1073.

E. Hoene, Simulating electromagnetic interactions in high power density converters, Proc. of 36th IEEE Power Electronics Specialists Conference, pp.1665-1670, 2005.
DOI : 10.1109/pesc.2005.1581854

S. Weber, S. Guttowski, E. Hoene, W. John, and H. , EMI coupling from automotive traction systems, 2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03., pp.591-594, 2003.
DOI : 10.1109/ICSMC2.2003.1428328

D. Baudry, C. Arcambal, A. Louis, B. Mazari, and P. Eudeline, Applications of the Near-Field Techniques in EMC Investigations, IEEE Transactions on Electromagnetic Compatibility, vol.49, issue.3, pp.485-493, 2007.
DOI : 10.1109/TEMC.2007.902194

K. P. Slattery, J. Neal, and W. Cui, Near-field measurements of VLSI devices, IEEE Transactions on Electromagnetic Compatibility, vol.41, issue.4, pp.374-384, 1999.
DOI : 10.1109/15.809825

P. Nicolae, I. Nicolae, and D. St?nescu, Using GTEM cells for immunity tests on electronic boards with microcontroller, 2012 IEEE International Symposium on Electromagnetic Compatibility, pp.44-49, 2012.
DOI : 10.1109/ISEMC.2012.6351752

X. K. Gao, E. K. Chua, and E. P. Li, Integrated EM immunity design and diagnosis system for electronic devices, Proc. of 2009 International Symposium on Electromagnetic Compatibility, pp.329-332, 2009.

J. M. Dienot and E. Batista, Real-Cases of Electromagnetic Immunity and Reliability in Embedded Electronics Architectures, European Electromagnetic Symposium, vol.87, pp.2-6, 2012.