C. D. Breach and F. W. Wulff, A brief review of selected aspects of the materials science of ball bonding, Microelectronics Reliability, vol.50, issue.1, pp.1-20, 2010.
DOI : 10.1016/j.microrel.2009.08.003

T. Brintlinger, S. Lim, K. H. Baloch, P. Alexander, Y. Qi et al., In Situ Observation of Reversible Nanomagnetic Switching Induced by Electric Fields, Situ Observation of Reversible Nanomagnetic Switching Induced by Electric Fields, pp.1219-1223, 2010.
DOI : 10.1021/nl9036406

P. Castany and M. Legros, Preparation of H-bar cross-sectional specimen for in situ TEM straining experiments: A FIB-based method applied to a nitrided Ti???6Al???4V alloy, Materials Science and Engineering: A, vol.528, issue.3, pp.1367-1371, 2011.
DOI : 10.1016/j.msea.2010.10.025
URL : https://hal.archives-ouvertes.fr/hal-00864910

J. N. Chapman, The investigation of magnetic domain structures in thin foils by electron microscopy, Journal of Physics D: Applied Physics, vol.17, issue.4, pp.623-647, 1984.
DOI : 10.1088/0022-3727/17/4/003

A. N. Chiaramonti, L. J. Thompson, W. F. Egelhoff, B. C. Kabius, and A. K. Petford-long, In situ TEM studies of local transport and structure in nanoscale multilayer films, situ TEM studies of local transport and structure in nanoscale multilayer films, pp.1529-1535, 2008.
DOI : 10.1016/j.ultramic.2008.04.008

S. Choi, G. Park, K. Kim, S. Cho, W. Yang et al., In Situ Observation of Voltage-Induced Multilevel Resistive Switching in Solid Electrolyte Memory, Situ Observation of Voltage-Induced Multilevel Resistive Switching in Solid Electrolyte Memory, pp.3272-3277, 2011.
DOI : 10.1002/adma.201100507

D. Creemer, J. F. Helveg, S. Hoveling, G. H. Ullmann, S. Molenbroek et al., Atomic-scale electron microscopy at ambient pressure, Citation analysis realized via ISI web of Knowledge, pp.993-998, 2008.
DOI : 10.1016/j.ultramic.2008.04.014

J. Cumings, E. Olsson, A. K. Petford-long, and Y. Zhu, Electric and Magnetic Phenomena Studied by In Situ Transmission Electron Microscopy, MRS Bulletin, vol.2, issue.02, pp.101-106, 2008.
DOI : 10.1103/PhysRevB.73.153401

J. Cumings, A. Zettl, M. R. Mccartney, and J. C. Spence, Electron Holography of Field-Emitting Carbon Nanotubes, Physical Review Letters, vol.88, issue.5, p.56804, 2002.
DOI : 10.1103/PhysRevLett.88.056804

R. F. Egerton, P. Li, and M. Malac, Radiation damage in the TEM and SEM, Micron, vol.35, issue.6, pp.399-409, 2004.
DOI : 10.1016/j.micron.2004.02.003

P. L. Gai, Developments Concerning in situ Environmental Cell High-Resolution Electron Microscopy and Applications to Catalysis, ChemInform, vol.21, issue.17, pp.161-173, 2002.
DOI : 10.1002/chin.200317279

D. Golberg, P. M. Costa, M. Wang, X. Wei, D. Tang et al., Nanomaterial Engineering and Property Studies in a Transmission Electron Microscope, Advanced Materials, vol.2, issue.2, pp.177-194, 2012.
DOI : 10.1002/adma.201102579

A. W. Grant, Q. Hu, and B. Kasemo, Transmission electron microscopy ??windows?? for nanofabricated structures, Nanotechnology, vol.15, issue.9, pp.1175-1181, 2004.
DOI : 10.1088/0957-4484/15/9/012

M. Han, D. J. Smith, and M. R. Mccartney, electron holographic analysis of biased Si n+-p junctions, Applied Physics Letters, vol.92, issue.14, p.143502, 2008.
DOI : 10.1063/1.2908045

C. T. Harris, J. A. Martinez, E. A. Shaner, J. Y. Huang, B. S. Swartzentruber et al., Fabrication of a nanostructure thermal property measurement platform, Nanotechnology, vol.22, issue.27, p.275308, 2011.
DOI : 10.1088/0957-4484/22/27/275308

J. Y. Huang, L. Qi, and J. Li, In situ imaging of layer-by-layer sublimation of suspended graphene, Nano Research, vol.8, issue.1, pp.43-50, 2010.
DOI : 10.1007/s12274-010-1006-4

J. P. Ibe, P. P. Bey, J. Brandow, S. L. Brizzolara, R. A. Burnham et al., On the electrochemical etching of tips for scanning tunneling microscopy, Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, vol.8, issue.4, pp.3570-3575, 1990.
DOI : 10.1116/1.576509

N. Ikarashi, H. Takeda, K. Yako, and M. Hane, electron holography of surface potential response to gate voltage application in a sub-30-nm gate-length metal-oxide-semiconductor field-effect transistor, Applied Physics Letters, vol.100, issue.14, 2012.
DOI : 10.1063/1.3700723

T. Ishida, Y. Nakajima, K. Kakushima, M. Mita, H. Toshiyoshi et al., TEM observation, Journal of Micromechanics and Microengineering, vol.20, issue.7, p.75011, 2010.
DOI : 10.1088/0960-1317/20/7/075011

M. Iwatsuki, K. Murooka, S. Kitamura, K. Takayanagi, and Y. Harada, Scanning Tunneling Microscope (STM) for Conventional Transmission Electron Microscope (TEM), J Electron Microsc, vol.40, pp.48-53, 1991.

L. Jalabert, T. Sato, I. Tadashi, H. Fujita, Y. Chalopin et al., Ballistic Thermal Conductance of a Lab-in-a-TEM Made Si Nanojunction, Nano Letters, vol.12, issue.10, 2012.
DOI : 10.1021/nl302379f

N. Jonge, R. De, and F. M. , Electron microscopy of specimens in liquid, Nature Nanotechnology, vol.25, issue.11, pp.695-704, 2011.
DOI : 10.1038/nnano.2011.161

J. Verbeeck, H. Tian, and P. Schattschneider, Production and application of electron vortex beams, Nature, vol.82, issue.20, 2010.
DOI : 10.1038/nature09366

C. Kallesøe, C. Wen, T. J. Booth, O. Hansen, P. Bøggild et al., In Situ TEM Creation and Electrical Characterization of Nanowire Devices, Situ TEM Creation and Electrical Characterization of Nanowire Devices, pp.2965-2970, 2012.
DOI : 10.1021/nl300704u

N. Kawamoto, M. Wang, X. Wei, D. Tang, Y. Murakami et al., Local temperature measurements on nanoscale materials using a movable nanothermocouple assembled in a transmission electron microscope, Nanotechnology, vol.22, issue.48, p.485707, 2011.
DOI : 10.1088/0957-4484/22/48/485707

T. Kim, S. Kim, E. Olson, and J. Zuo, In situ measurements and transmission electron microscopy of carbon nanotube field-effect transistors, Ultramicroscopy, vol.108, issue.7, pp.613-618, 2008.
DOI : 10.1016/j.ultramic.2007.10.007

T. Kim, J. Zuo, E. A. Olson, and I. Petrov, Imaging suspended carbon nanotubes in field-effect transistors configured with microfabricated slits for transmission electron microscopy, Applied Physics Letters, vol.87, issue.17, pp.173108-173108, 2005.
DOI : 10.1063/1.2115070

M. Klimenkov, W. Matz, and J. Von-borany, In situ observation of electron-beam-induced ripening of Ge clusters in thin SiO2 layers, Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol.168, issue.3, pp.367-374, 2000.
DOI : 10.1016/S0168-583X(99)01075-7

J. Kling, X. Tan, W. Jo, H. Kleebe, H. Fuess et al., In Situ Transmission Electron Microscopy of Electric Field-Triggered Reversible Domain Formation in Bi-Based Lead-Free Piezoceramics, Journal of the American Ceramic Society, vol.70, issue.9, pp.2452-2455, 2010.
DOI : 10.1111/j.1551-2916.2010.03778.x

L. P. Kubin and F. Louchet, Analysis of softening in the Fe???C system from in situ and conventional experiments-I. In situ experiments, Acta Metallurgica, vol.27, issue.3, pp.337-342, 1979.
DOI : 10.1016/0001-6160(79)90026-9

J. Liu, J. Xu, Y. Ni, F. Fan, C. Zhang et al., Electron Beam Irradiation, ACS Nano, vol.6, issue.5, pp.4500-4507, 2012.
DOI : 10.1021/nn301310m

Q. Liu, J. Sun, H. Lv, S. Long, K. Yin et al., Response to ???Comment on Real-Time Observation on Dynamic Growth/Dissolution of Conductive Filaments in Oxide-Electrolyte-Based ReRAM???, Advanced Materials, vol.12, issue.2, pp.1844-1849
DOI : 10.1002/adma.201203771

K. Lu, W. Wu, H. Ouyang, Y. Lin, Y. Huang et al., The Influence of Surface Oxide on the Growth of Metal/Semiconductor Nanowires, The Influence of Surface Oxide on the Growth of Metal/Semiconductor Nanowires, pp.2753-2758, 2011.
DOI : 10.1021/nl201037m

P. A. Midgley and R. E. Dunin-borkowski, Electron tomography and holography in materials science, Nature Materials, vol.253, issue.4, pp.271-280, 2009.
DOI : 10.1038/nmat2406

M. Muoth, F. Gramm, K. Asaka, L. Durrer, T. Helbling et al., Tilted-view transmission electron microscopy-access for chirality assignment to carbon nanotubes integrated in MEMS, Procedia Chemistry, vol.1, issue.1, pp.601-604, 2009.
DOI : 10.1016/j.proche.2009.07.150

Y. Murakami, N. Kawamoto, D. Shindo, I. Ishikawa, S. Deguchi et al., Simultaneous measurements of conductivity and magnetism by using microprobes and electron holography, Applied Physics Letters, vol.88, issue.22, 2006.
DOI : 10.1063/1.2208384

J. Nelayah, M. Kociak, O. Stephan, F. J. Garcia-de-abajo, M. Tence et al., Mapping surface plasmons on a single metallic nanoparticle, Nature Physics, vol.28, issue.5, pp.348-353, 2007.
DOI : 10.1016/0304-3991(95)00029-Z

H. Nishizawa, F. Hori, and R. Oshima, In-situ HRTEM observation of the melting-crystallization process of silicon, Journal of Crystal Growth, vol.236, issue.1-3, pp.51-58, 2002.
DOI : 10.1016/S0022-0248(01)02156-X

S. H. Oh, M. Legros, D. Kiener, and G. Dehm, In situ observation of dislocation nucleation and??escape in a submicrometre aluminium single??crystal, Nature Materials, vol.100, issue.2, pp.95-100, 2009.
DOI : 10.1038/nmat2370

B. Pant, B. L. Allen, T. Zhu, K. Gall, and O. N. Pierron, A versatile microelectromechanical system for nanomechanical testing, Applied Physics Letters, vol.98, issue.5, p.53506, 2011.
DOI : 10.1063/1.3553195

S. Park, M. J. Kim, and O. Lourie, DIRECT TWO-DIMENSIONAL ELECTRICAL MEASUREMENT USING POINT PROBING FOR DOPING AREA IDENTIFICATION OF NANODEVICE IN TEM, NANO 05, p.61, 2010.
DOI : 10.1142/S1793292010001810

D. W. Pohl, Dynamic piezoelectric translation devices, Review of Scientific Instruments, vol.58, issue.1, p.54, 1987.
DOI : 10.1063/1.1139566

D. Shindo, K. Takahashi, Y. Murakami, K. Yamazaki, S. Deguchi et al., Development of a multifunctional TEM specimen holder equipped with a piezodriving probe and a laser irradiation port, Journal of Electron Microscopy, vol.58, issue.4, pp.245-249, 2009.
DOI : 10.1093/jmicro/dfp018

A. Siria, T. Barois, K. Vilella, S. Perisanu, A. Ayari et al., Electron Fluctuation Induced Resonance Broadening in Nano Electromechanical Systems: The Origin of Shear Force in Vacuum, Nano Letters, vol.12, issue.7, pp.3551-3556, 2012.
DOI : 10.1021/nl301618p

E. A. Sutter, P. W. Sutter, E. Uccelli, and A. Fontcuberta-i-morral, Supercooling of nanoscale Ga drops with controlled impurity levels, Physical Review B, vol.84, issue.19, 2011.
DOI : 10.1103/PhysRevB.84.193303

K. Svensson, Y. Jompol, H. Olin, and E. Olsson, Compact design of a transmission electron microscope-scanning tunneling microscope holder with three-dimensional coarse motion, Review of Scientific Instruments, vol.74, issue.11, pp.4945-4947, 2003.
DOI : 10.1063/1.1614872

M. Takeguchi, M. Shimojo, R. Che, and K. Furuya, Fabrication of a nano-magnet on a piezo-driven tip in a TEM sample holder, Journal of Materials Science, vol.53, issue.9, pp.2627-2630, 2006.
DOI : 10.1007/s10853-006-7825-8

T. Tanabe, S. Muto, and S. Tohtake, Development of new TEM specimen holder for cathodoluminescence detection, Journal of Electron Microscopy, vol.51, issue.5, pp.311-313, 2002.
DOI : 10.1093/jmicro/51.5.311

J. Tang, C. Wang, F. Xiu, A. J. Hong, S. Chen et al., Ge nanowire heterostructure transistors, Nanotechnology, vol.21, issue.50, p.505704, 2010.
DOI : 10.1088/0957-4484/21/50/505704

A. C. Twitchett, R. E. Dunin-borkowski, and P. A. Midgley, Quantitative Electron Holography of Biased Semiconductor Devices, Physical Review Letters, vol.88, issue.23, p.238302, 2002.
DOI : 10.1103/PhysRevLett.88.238302

T. Uhlig, M. Heumann, and J. Zweck, Development of a specimen holder for in situ generation of pure in-plane magnetic fields in a transmission electron microscope, Ultramicroscopy, vol.94, issue.3-4, pp.193-196, 2003.
DOI : 10.1016/S0304-3991(02)00264-4

M. A. Verheijen, J. J. Donkers, J. F. Thomassen, J. J. Van-den-broek, R. A. Van-der-rijt et al., heating and electrical resistance measurements, Review of Scientific Instruments, vol.75, issue.2, pp.426-429, 2004.
DOI : 10.1063/1.1611616

Y. G. Wang, T. H. Wang, X. W. Lin, and V. P. Dravid, electron beam deposition, Nanotechnology, vol.17, issue.24, pp.6011-6015, 2006.
DOI : 10.1088/0957-4484/17/24/018

G. Yi, W. A. Nicholson, C. Lim, J. Chapman, S. Mcvitie et al., A new design of specimen stage for in situ magnetising experiments in the transmission electron microscope, Ultramicroscopy, vol.99, issue.1, pp.65-72, 2004.
DOI : 10.1016/S0304-3991(03)00148-7

T. Yokosawa, T. Alan, G. Pandraud, B. Dam, and H. Zandbergen, In-situ TEM on (de)hydrogenation of Pd at 0.5?4.5 bar hydrogen pressure and, Ultramicroscopy, vol.112, pp.20-400, 2012.

T. Yonezawa, S. Arai, H. Takeuchi, T. Kamino, and K. Kuroda, Preparation of naked silver nanoparticles in a TEM column and direct in situ observation of their structural changes at high temperature, Chemical Physics Letters, vol.537, pp.65-68, 2012.
DOI : 10.1016/j.cplett.2012.03.097

A. H. Zewail, Four-Dimensional Electron Microscopy, Science, vol.328, issue.5975, pp.187-193, 2010.
DOI : 10.1126/science.1166135

M. Zhang, E. Olson, R. D. Twesten, J. G. Wen, L. H. Allen et al., In situ Transmission Electron Microscopy Studies Enabled by Microelectromechanical System Technology, situ Transmission Electron Microscopy Studies Enabled by Microelectromechanical System Technology, pp.1802-1807, 2005.
DOI : 10.1103/PhysRevA.13.2287

Y. Zhu and H. D. Espinosa, An electromechanical material testing system for in situ electron microscopy and applications, Proceedings of the National Academy of Sciences, vol.102, issue.41, pp.14503-14508, 2005.
DOI : 10.1073/pnas.0506544102