Altitude and Underground Real-Time SER Characterization of CMOS 65 nm SRAM

Jean-Luc Autran (1) , P. Roche , S. Sauze , G. Gasiot , Daniela Munteanu (1) , P. Loaiza (2) , M. Zampaolo (2) , J. Borel

1 IM2NP - Institut des Matériaux, de Microélectronique et des Nanosciences de Provence
2 LSM - UMR 6417 - Laboratoire Souterrain de Modane

We report real-time SER characterization of CMOS 65 nm SRAM memories in both altitude and underground environments. Neutron and alpha-particle SERs are compared with data obtained from accelerated tests and values previously measured for CMOS 130 nm technology.

Domaines: Micro et nanotechnologies/Microélectronique

Jean-Luc Autran, P. Roche, S. Sauze, G. Gasiot, Daniela Munteanu, et al.. Altitude and Underground Real-Time SER Characterization of CMOS 65 nm SRAM. IEEE Transactions on Nuclear Science, 2009, 56 (4, 2), pp.2258-2266. ⟨10.1109/TNS.2009.2012426⟩. ⟨hal-01430112⟩