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Error analysis for near-field EMC problems based on multipolar expansion approach

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https://hal.archives-ouvertes.fr/hal-01393474
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Zhao Li, François Tavernier, Arnaud Bréard, Laurent Krähenbühl, Damien Voyer. Error analysis for near-field EMC problems based on multipolar expansion approach. IEEE CEFC, Nov 2016, Miami, FL, United States. pp.CD, ⟨10.1109/CEFC.2016.7816346⟩. ⟨hal-01393474⟩

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