Investigation of the directional emissivity of materials using infrared thermography coupled with a periodic excitation

Laurent Ibos (1) , Jean-Pierre Monchau (1) , Vincent Feuillet (1) , Jean Dumoulin (2, 3) , Patrick Ausset (4) , Jacques Hameury (5) , Bruno Hay (5)

1 CERTES EA 3481 - Centre d'Etudes et Recherches en Thermique, Environnement et Systèmes [Créteil]
2 IFSTTAR/COSYS/SII - Structure et Instrumentation Intégrée
3 I4S - Statistical Inference for Structural Health Monitoring
4 EFLUVE - Enveloppes fluides : de la ville à l'exobiologie
5 LNE - Laboratoire National de Métrologie et d'Essais [Trappes]

This article concerns the determination of the directional emissivity of materials. Several materials (conducting materials or dielectrics) are investigated and the influence of surface roughness is also considered. The experimental method used for the determination is based on the use of a periodic excitation and the recording of the surface temperature variations of the sample using infrared thermography. Several consecutive measurements are performed for emission angles varying from 0° (for the determinat ion of normal emissivity) to 85°. The experimental device developed (SPIDER instrument) is simple compared to existing devices but the variation of directional emissivity is limited to the spectral bandwith of the camera used.

Mots clés: Infrared thermography; Emissivity; esitmation

Domaines: Thermique [physics.class-ph]

Laurent Ibos, Jean-Pierre Monchau, Vincent Feuillet, Jean Dumoulin, Patrick Ausset, et al.. Investigation of the directional emissivity of materials using infrared thermography coupled with a periodic excitation. QIRT 2016, Jul 2016, Gdańsk Poland. ⟨10.21611/qirt.2016.031⟩. ⟨hal-01388188⟩