Determination of 4H-SiC Ionization Rates Using OBIC Based on Two-Photon Absorption

Hassan Hamad (1, 2) , Christophe Raynaud (1, 2) , Pascal Bevilacqua (1, 2) , Sigo Scharnholz (3) , Bertrand Vergne (3) , Dominique Planson (1, 2)

1 EE - Ampère, Département Energie Electrique
2 INSA Lyon - Institut National des Sciences Appliquées de Lyon
3 ISL - Institut franco-allemand de recherches de Saint-Louis

Optical Beam Induced Current (OBIC) measurements are performed on 4H-SiC avalanche diodes with a very thin and a highly doped active region. A pulsed green laser, with a wavelength of 532 nm, illuminates a reverse biased diode leading to generate electron-hole pairs in the space charge region. Comparison between the 4H-SiC bandgap and the incident photon energy shows that single photon absorption process can be neglected and two-photon absorption process dominates in this case. Ionization rates are then extracted from multiplication curve in a high electric field range (3 to 5 MV.cm–1). Results are in good agreement with previous ones obtained on the same diodes using single photon absorption process.

Mots clés: OBIC; 4H-SiC; two-photon absorption; Ionization rates; avalanche diodes; high electric field

Domaines: Energie électrique

Hassan Hamad, Christophe Raynaud, Pascal Bevilacqua, Sigo Scharnholz, Bertrand Vergne, et al.. Determination of 4H-SiC Ionization Rates Using OBIC Based on Two-Photon Absorption. Materials Science Forum, 2016, 858, pp.245 - 248. ⟨10.4028/www.scientific.net/MSF.858.245⟩. ⟨hal-01388035⟩