Performance impact of various SEE mechanisms in classical analog-to-digital converter architectures

Abstract : An original methodology is presented for characterizing SEE impact on ADCs performance parameters. Events produced by a pulsed laser and heavy ions are analyzed with an ADC testing dedicated software coupled with the THESIC+ tester.
Complete list of metadatas

https://hal.archives-ouvertes.fr/hal-01376266
Contributor : Lucie Torella <>
Submitted on : Tuesday, October 4, 2016 - 3:53:49 PM
Last modification on : Thursday, October 4, 2018 - 11:14:03 AM

Licence


Distributed under a Creative Commons Attribution - NonCommercial 4.0 International License

Identifiers

  • HAL Id : hal-01376266, version 1

Citation

V. Pouget, P. Fouillat, R. Velazco, D. Lewis, D. Dallet. Performance impact of various SEE mechanisms in classical analog-to-digital converter architectures. IEEE Nuclear and Space Radiation Effects Conference (NSREC'03), Jul 2003, Monterey, CA, United States. ⟨hal-01376266⟩

Share

Metrics

Record views

145