Highlighting material structure with transmission electron diffraction correlation coefficient maps

Ákos K. Kiss , Edgar F. Rauch (1) , János L. Lábár

1 SIMaP - Science et Ingénierie des Matériaux et Procédés

Correlation coefficient maps are constructed by computing the differences between neighboring diffraction patterns collected in a transmission electron microscope in scanning mode. The maps are shown to highlight material structural features like grain boundaries, second phase particles or dislocations. The inclination of the inner crystal interfaces are directly deduced from the resulting contrast. (C) 2016 Elsevier B.V. All rights reserved.

Domaines: Matériaux

Ákos K. Kiss, Edgar F. Rauch, János L. Lábár. Highlighting material structure with transmission electron diffraction correlation coefficient maps. Ultramicroscopy, 2016, 163 (163), pp.31-37. ⟨10.1016/j.ultramic.2016.01.006⟩. ⟨hal-01367850⟩