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Built-in test of millimeter-wave circuits based on non-intrusive sensors

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https://hal.sorbonne-universite.fr/hal-01359620
Contributor : Haralampos Stratigopoulos <>
Submitted on : Friday, September 2, 2016 - 5:47:53 PM
Last modification on : Tuesday, May 11, 2021 - 11:37:50 AM

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  • HAL Id : hal-01359620, version 1

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Athanasios Dimakos, Haralampos-G. Stratigopoulos, Alexandre Siligaris, Salvador Mir, Emeric de Foucauld. Built-in test of millimeter-wave circuits based on non-intrusive sensors. Design, Automation & Test in Europe Conference, Mar 2016, Dresden, Germany. ⟨hal-01359620⟩

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