Automated rejection and repair of bad trials in MEG/EEG

Mainak Jas 1, 2 Denis Engemann 3 Federico Raimondo 4 Yousra Bekhti 1, 2 Alexandre Gramfort 1
1 LTCI - Laboratoire Traitement et Communication de l'Information
2 Télécom ParisTech
3 UPMC - Université Pierre et Marie Curie - Paris 6
4 Departamento de Computación [Buenos Aires]
Abstract : We present an automated solution for detecting bad trials in magneto-/electroencephalography (M/EEG). Bad trials are commonly identified using peak-to-peak rejection thresholds that are set manually. This work proposes a solution to determine them automatically using cross-validation. We show that automatically selected rejection thresholds perform at par with manual thresholds, which can save hours of visual data inspection. We then use this automated approach to learn a sensor-specific rejection threshold. Finally, we use this approach to remove trials with finer precision and/or partially repair them using interpolation. We illustrate the performance on three public datasets. The method clearly performs better than a competitive benchmark on a 19-subject Faces dataset.
Keywords : magnetoencephalography electroencephalography preprocessing artifact rejection automation machine learning
Type de document :
Communication dans un congrès
6th International Workshop on Pattern Recognition in Neuroimaging (PRNI), Jun 2016, Trento, Italy
Liste complète des métadonnées

Littérature citée [19 références]  Voir  Masquer  Télécharger
https://hal.archives-ouvertes.fr/hal-01313458
Contributeur : Mainak Jas <>
Soumis le : mardi 10 mai 2016 - 01:57:03
Dernière modification le : mercredi 20 février 2019 - 14:41:19
Document(s) archivé(s) le : mardi 15 novembre 2016 - 23:52:31

Fichier

automated-rejection-repair.pdf
Fichiers produits par l'(les) auteur(s)

Identifiants

  • HAL Id : hal-01313458, version 1

Collections

INSTITUT-TELECOM | UPMC | PARISTECH | UNIV-PARIS-SACLAY | SORBONNE-UNIVERSITE | LTCI

Citation

Mainak Jas, Denis Engemann, Federico Raimondo, Yousra Bekhti, Alexandre Gramfort. Automated rejection and repair of bad trials in MEG/EEG. 6th International Workshop on Pattern Recognition in Neuroimaging (PRNI), Jun 2016, Trento, Italy. 〈hal-01313458〉

Exporter

BibTeX TEI DC DCterms EndNote

Partager

Métriques

Consultations de la notice

385

Téléchargements de fichiers

995

Contact

support.ccsd.cnrs.fr
hal.support@ccsd.cnrs.fr
Logo CCSD