Automated rejection and repair of bad trials in MEG/EEG

Mainak Jas 1, 2 Denis Engemann 3 Federico Raimondo 4 Yousra Bekhti 1, 2 Alexandre Gramfort 1
1 LTCI - Laboratoire Traitement et Communication de l'Information
2 Télécom ParisTech
3 UPMC - Université Pierre et Marie Curie - Paris 6
4 Departamento de Computación [Buenos Aires]
Abstract : We present an automated solution for detecting bad trials in magneto-/electroencephalography (M/EEG). Bad trials are commonly identified using peak-to-peak rejection thresholds that are set manually. This work proposes a solution to determine them automatically using cross-validation. We show that automatically selected rejection thresholds perform at par with manual thresholds, which can save hours of visual data inspection. We then use this automated approach to learn a sensor-specific rejection threshold. Finally, we use this approach to remove trials with finer precision and/or partially repair them using interpolation. We illustrate the performance on three public datasets. The method clearly performs better than a competitive benchmark on a 19-subject Faces dataset.
Keywords : magnetoencephalography electroencephalography preprocessing artifact rejection automation machine learning
Type de document :
Communication dans un congrès
6th International Workshop on Pattern Recognition in Neuroimaging (PRNI), Jun 2016, Trento, Italy
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Soumis le : mardi 10 mai 2016 - 01:57:03
Dernière modification le : mercredi 21 mars 2018 - 18:57:40
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TELECOM-PARISTECH | UPMC | PARISTECH | UNIV-PARIS-SACLAY

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Mainak Jas, Denis Engemann, Federico Raimondo, Yousra Bekhti, Alexandre Gramfort. Automated rejection and repair of bad trials in MEG/EEG. 6th International Workshop on Pattern Recognition in Neuroimaging (PRNI), Jun 2016, Trento, Italy. 〈hal-01313458〉

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