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Automated rejection and repair of bad trials in MEG/EEG

Abstract : We present an automated solution for detecting bad trials in magneto-/electroencephalography (M/EEG). Bad trials are commonly identified using peak-to-peak rejection thresholds that are set manually. This work proposes a solution to determine them automatically using cross-validation. We show that automatically selected rejection thresholds perform at par with manual thresholds, which can save hours of visual data inspection. We then use this automated approach to learn a sensor-specific rejection threshold. Finally, we use this approach to remove trials with finer precision and/or partially repair them using interpolation. We illustrate the performance on three public datasets. The method clearly performs better than a competitive benchmark on a 19-subject Faces dataset.
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Contributor : Mainak Jas <>
Submitted on : Tuesday, May 10, 2016 - 1:57:03 AM
Last modification on : Monday, December 14, 2020 - 9:47:24 AM
Long-term archiving on: : Tuesday, November 15, 2016 - 11:52:31 PM


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  • HAL Id : hal-01313458, version 1


Mainak Jas, Denis Engemann, Federico Raimondo, Yousra Bekhti, Alexandre Gramfort. Automated rejection and repair of bad trials in MEG/EEG. 6th International Workshop on Pattern Recognition in Neuroimaging (PRNI), Jun 2016, Trento, Italy. ⟨hal-01313458⟩



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