MICROSCOPIC THERMAL CHARACTERIZATION OF C/C AND C/C-SiC COMPOSITES

Julien Jumel (1) , Jean-Claude Krapez (1) , F Lepoutre (1) , Franck Enguehard (2) , D Rochais (2) , G Neuer (3) , M Cataldi (4)

1 ONERA - The French Aerospace Lab [Châtillon]
2 CEA Le Ripault - CEA Le Ripault
3 Universität Stuttgart [Stuttgart]
4 SPS - Snecma Propulsion Solide

To measure the thermal properties of C/C and C/C-SiC composites constituents, photoreflectance microscopy is used. Specific methods are developed to cope with experimental artefacts (material semi-transparency, convolution effects), so as with fibers and matrix specificities (strong thermal anisotropy, geometric effects ...). Experimental results are presented demonstrating the interest of photoreflectance microscopy for a quantitative determination of the microscopic thermal properties of these complex graphite materials.

Domaines: Thermique [physics.class-ph]

Julien Jumel, Jean-Claude Krapez, F Lepoutre, Franck Enguehard, D Rochais, et al.. MICROSCOPIC THERMAL CHARACTERIZATION OF C/C AND C/C-SiC COMPOSITES. 2001 Review of Progress in Quantitative Non Destructive Evaluation, Jul 2001, Brunswick, United States. ⟨hal-01287490⟩