Improved analyzer multilayers for aluminium and boron detection with x-ray fluorescence, Applied Optics, vol.40, issue.16, pp.2747-2754, 2001. ,
DOI : 10.1364/AO.40.002747
Multilayer mirror for x rays below 190??????eV, Optics Letters, vol.26, issue.11, pp.792-794, 2001. ,
DOI : 10.1364/OL.26.000792
Automatic characterization of layers stacks from reflectivity measurements. Application to the study of the validity conditions of grazing X-rays reflectometry, Journal of Optics, vol.21, issue.4, pp.183-191, 1990. ,
DOI : 10.1088/0150-536X/21/4/005
Soft-x-ray polarimeter with multilayer optics: complete analysis of the polarization state of light, Applied Optics, vol.38, issue.19, pp.4074-4088, 1999. ,
DOI : 10.1364/AO.38.004074
Bragg reflectivity of layered synthetic microstructures in the x-ray anomalous scattering regions, Applied Optics, vol.22, issue.1, pp.17-19, 1983. ,
DOI : 10.1364/AO.22.000017
Polarization Performance of a New Spectrometer Based on a Multilayer-Coated Laminar Grating in the 150-190-eV Region, Optical Review, vol.51, issue.1, pp.58-62, 2003. ,
DOI : 10.1007/s10043-003-0058-z