La/B4C small period multilayer interferential mirrors for the analysis of boron

Abstract : A La/B4C multilayer interferential mirror with small period d (4.8 nm) was produced by diode sputtering for the detection of the boron K emission by wavelength-dispersive x-ray spectrometry at a large Bragg angle (close to 45°). The structure of the mirror has been characterized by grazing incidence x-ray reflectometry, and its performance at the energy of the boron K emission (183 eV) was evaluated by means of polarized synchrotron radiation. A spectrometric measurement shows that the La/B4C mirror has improved the detection limit of boron using by a factor of 2 with respect to similar Mo/B4C mirrors, and by a factor of 4 with respect to a lead stearate crystal.
Document type :
Journal articles
Complete list of metadatas

Cited literature [6 references]  Display  Hide  Download

https://hal.archives-ouvertes.fr/hal-01232846
Contributor : Philippe Jonnard <>
Submitted on : Tuesday, November 24, 2015 - 11:29:12 AM
Last modification on : Wednesday, May 15, 2019 - 4:08:57 AM
Long-term archiving on: Friday, April 28, 2017 - 2:59:12 PM

File

LaB4C.pdf
Files produced by the author(s)

Identifiers

Citation

J.-M André, Philippe Jonnard, C Michaelsen, J Wiesmann, F Bridou, et al.. La/B4C small period multilayer interferential mirrors for the analysis of boron. X-Ray Spectrometry, Wiley, 2004, 34 (3), pp.203-206. ⟨10.1002/xrs.793⟩. ⟨hal-01232846⟩

Share

Metrics

Record views

271

Files downloads

104