Hao Zou, Yasser Moursy, Ramy Iskander, Jean-Paul Chaput, Marie-Minerve Louërat, et al.. A CAD integrated solution of substrate modeling for industrial IC design.
2015 20th International Mixed-Signal Testing Workshop (IMSTW), Jun 2015, Paris, France.
⟨10.1109/IMS3TW.2015.7177885⟩.
⟨hal-01230118⟩