Camillo Stefanucci, Pietro Buccella, yasser Moursy, Hao Zou, Ramy Iskander, et al.. Substrate modeling to improve reliability of high voltage technologies.
20th International Mixed-Signal Testing Workshop (IMSTW), 2015, Paris, Jun 2015, Paris, France.
⟨10.1109/IMS3TW.2015.7177884⟩.
⟨hal-01228157⟩