Optical properties of PZT thin films deposited on a ZnO buffer layer

T Schneider (1) , Dominique Leduc (2) , J. Cardin (3) , Cyril Lupi (2) , N Barreau (4) , H Gundel (1)

1 IETR - Institut d'Électronique et des Technologies du numéRique
2 GeM - Institut de Recherche en Génie Civil et Mécanique
3 CIMAP - UMR 6252 - Centre de recherche sur les Ions, les MAtériaux et la Photonique
4 IMN - Institut des Matériaux Jean Rouxel

The optical properties of lead zirconate titanate (PZT) thin films deposited on ZnO were studied by m-lines spectroscopy. In order to retrieve the refractive index and the thickness of both layers from the m-lines spectra, we develop a numerical algorithm for the case of a two-layer system and show its robustness in the presence of noise. The sensitivity of the algorithm of the two-layer model allows us to relate the observed changes in the PZT refractive index to the PZT structural change due to the ZnO interface of the PZT/ZnO optical waveguide.

Mots clés: m-lines; composite waveguides; PZT PACS:

Domaines: Matériaux; Optique / photonique; Science des matériaux [cond-mat.mtrl-sci]; Electromagnétisme

T Schneider, Dominique Leduc, J. Cardin, Cyril Lupi, N Barreau, et al.. Optical properties of PZT thin films deposited on a ZnO buffer layer. Optical Materials, 2007, ⟨10.1016/j.optmat.2006.10.015⟩. ⟨hal-01219965⟩