Investigation of Electrical Characteristics of Multi-Gate Bulk nMOSFET

Inga Jolanta Zbierska 1, 2 L. Militaru 2 F. Calmon 2 Sylvain Feruglio 3 Guo-Neng Lu 1
1 INL - CSH - INL - Conception de Systèmes Hétérogènes
INL - Institut des Nanotechnologies de Lyon
2 INL - DE - INL - Dispositifs Electroniques
INL - Institut des Nanotechnologies de Lyon
3 SYEL - Systèmes Electroniques
LIP6 - Laboratoire d'Informatique de Paris 6
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https://hal.archives-ouvertes.fr/hal-01201800
Contributor : Sylvain Feruglio <>
Submitted on : Friday, September 18, 2015 - 10:10:30 AM
Last modification on : Thursday, March 21, 2019 - 2:44:09 PM

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Inga Jolanta Zbierska, L. Militaru, F. Calmon, Sylvain Feruglio, Guo-Neng Lu. Investigation of Electrical Characteristics of Multi-Gate Bulk nMOSFET. 29th International Conference on Microelectronics - MIEL 2014, May 2014, Belgrade, Serbia. pp.95 - 98, ⟨10.1109/MIEL.2014.6842094⟩. ⟨hal-01201800⟩

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