High Level Modeling of Signal Integrity in a USB 3.0 System

Ruomin Wang 1 Julien Denoulet 1 Sylvain Feruglio 1 Farouk Vallette 1 Patrick Garda 1
1 SYEL - Systèmes Electroniques
LIP6 - Laboratoire d'Informatique de Paris 6
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https://hal.archives-ouvertes.fr/hal-01201797
Contributor : Sylvain Feruglio <>
Submitted on : Friday, September 18, 2015 - 10:03:57 AM
Last modification on : Thursday, March 21, 2019 - 2:16:51 PM

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  • HAL Id : hal-01201797, version 1

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Ruomin Wang, Julien Denoulet, Sylvain Feruglio, Farouk Vallette, Patrick Garda. High Level Modeling of Signal Integrity in a USB 3.0 System. Micro/Nano-Electronics Packaging and Assembly, Design and Manufacturing (MiNaPAD), May 2014, Grenoble, France. ⟨hal-01201797⟩

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