G. Accueil, http://www.gn-meba.org/index.htm [2] FP initiative, International initiative on x-ray fundamental parameters, FP Initiative, International Initiative on X-Ray Fundamental Parameters, 2013.

X. Llovet, E. Heikinheimo, A. N. Galindo, C. Merlet, J. F. Bello et al., An inter-laboratory comparison of the electron probe microanalysis of glass geochemistry, Quaternary International An interlaboratory comparison of energy dispersive X-ray microanalysis (EDX) of titanium and zirkonium nitrides, Mikrochim Acta2010 -Conformity assessment --General requirements for proficiency testing The International Harmonized Protocol for the proficiency testing of analytical chemistry laboratories Cauchois and Sénémaud Tables of wavelengths of X-ray emission lines and absorption edges, X-Ray Spectrom and references therein. doi:10.1002/xrs.1293. [9] J.-L. Pouchou, Les méthodes de quantification en microanalyse X Comparison of a Number of ZAF-Correction Alternatives in X-Ray-Microanalysis Use of ZAF and PAP matrix correction models for the determination of carbon in steels by electron probe microanalysis, X-Ray Spectrom, (95)00088-7. [5] M. Procop, A. Röder1300180605. [12] J.-L. Pouchou, F. Pichoir, Surface film X-ray microanalysis, pp.34-36, 1980.

J. Pouchou, X-Ray microanalysis of stratified specimens, Analytica Chimica Acta, vol.283, issue.1, pp.81-97, 1993.
DOI : 10.1016/0003-2670(93)85212-3

J. Riveros, G. Castellano, D. E. Newbury, and N. W. Ritchie, Review of ?(?z) curves in electron probe microanalysis, X- Ray Spectrom, Scanning, vol.22, pp.35-141, 1993.