Two Sine-Wave Generation Methods for Testing High Resolution ADCs

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https://hal.archives-ouvertes.fr/hal-01182499
Contributor : Dominique Dallet <>
Submitted on : Friday, July 31, 2015 - 4:32:49 PM
Last modification on : Tuesday, February 13, 2018 - 9:52:19 AM

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  • HAL Id : hal-01182499, version 1

Citation

Dominique Dallet, Breitenbach Arvid. Two Sine-Wave Generation Methods for Testing High Resolution ADCs. IWADC98, 1998, Naples, Italy. pp.429-433. ⟨hal-01182499⟩

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