How SI/EMC and reliability issues could interact together in embedded electronic systems?

K. Weide-Zaage (1) , A. Moujbani (1) , G. Duchamp (2) , Tristan Dubois (2) , Frédéric Verdier (2) , H. Fremont (2)

1 IMS - Institute of Microelectronic Systems - AS
2 IMS - Laboratoire de l'intégration, du matériau au système

Domaines: Micro et nanotechnologies/Microélectronique; Electronique

K. Weide-Zaage, A. Moujbani, G. Duchamp, Tristan Dubois, Frédéric Verdier, et al.. How SI/EMC and reliability issues could interact together in embedded electronic systems?. Joint IEEE International Symposium on Electromagnetic Compatibility and EMC Europe, Aug 2015, Dresden, Germany. ⟨hal-01180993⟩