MONOX: a characterization tool for the X-UV range

Abstract : A new laboratory apparatus devoted to the characterization of various devices for the X-UV range (100-5000 eV), such as mirrors, diffraction gratings, spectrometers or detectors is described. The apparatus includes open x-ray tubes as x-ray sources, a two-crystal monochromator for wavelength selection and a goniometer. Various examples of its use are presented : dispersive mode where the radiation coming from the x-ray tube is dispersed by the two-crystal monochromator, spectrometric mode where the goniometer is used as a plane x-ray spectrometer and reflectometric mode where a selected wavelength is used to perform absolute reflectivity measurements.
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J.-M André, A Avila, R Barchewitz, R Benbalagh, R Delaunay, et al.. MONOX: a characterization tool for the X-UV range. European Physical Journal: Applied Physics, EDP Sciences, 2005, 31, pp.147-152. ⟨10.1051/epjap:2005047⟩. ⟨hal-01179271⟩

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