Quantitative analysis of shadow X-ray Magnetic Circular Dichroism Photo-Emission Electron Microscopy

Ségolène Jamet 1 Sandrine da Col 1 Nicolas Rougemaille 1 Alexis Wartelle 1 Andrea Locatelli 2 T.O. Mentes 2 B. Santos Burgos 2 Raja Afid 1 Laurent Cagnon 1 Sebastian Bochmann 3 Julien Bachmann 3 Olivier Fruchart 1 Jean-Christophe Toussaint 1
1 MNM - Micro et NanoMagnétisme
NEEL - Institut Néel
2 Elettra Sincrotrone Trieste
3 Friedrich Alexander University [Erlangen-Nürnberg]
Abstract : Shadow X-ray Magnetic Circular Dichroism Photo-Emission Electron Microscopy (XMCD-PEEM) is a recent technique, in which the photon intensity in the shadow of an object lying on a surface, may be used to gather information about the three-dimensional magnetization texture inside the object. Our purpose here is to lay the basis of a quantitative analysis of this technique. We first discuss the principle and implementation of a method to simulate the contrast expected from an arbitrary micromagnetic state. Text book examples and successful comparison with experiments are then given. Instrumental settings are finally discussed, having an impact on the contrast and spatial resolution : photon energy, microscope extraction voltage and plane of focus, microscope background level, electric-field related distortion of three-dimensional objects, Fresnel diffraction or photon scattering.
Type de document :
Article dans une revue
Liste complète des métadonnées
https://hal.archives-ouvertes.fr/hal-01165227
Contributeur : Ségolène Jamet <>
Soumis le : mardi 29 septembre 2015 - 15:31:09
Dernière modification le : vendredi 25 octobre 2019 - 11:02:22
Archivage à long terme le : mercredi 26 avril 2017 - 22:32:31

Fichiers

xmcd-peem-technical.pdf
Fichiers produits par l'(les) auteur(s)

Identifiants

Collections

CNRS | UGA | NEEL

Citation

Ségolène Jamet, Sandrine da Col, Nicolas Rougemaille, Alexis Wartelle, Andrea Locatelli, et al.. Quantitative analysis of shadow X-ray Magnetic Circular Dichroism Photo-Emission Electron Microscopy. Physical Review B : Condensed matter and materials physics, American Physical Society, 2015, 92 (14), pp.144428. ⟨10.1103/PhysRevB.92.144428⟩. ⟨hal-01165227v2⟩

Exporter

BibTeX TEI DC DCterms EndNote

Partager

Métriques

Consultations de la notice

276

Téléchargements de fichiers

397

Contact

CCSD