A Procedure for Alternate Test Feature Design and Selection

Abstract : This paper is a practical illustration of the adoption of alternate tests based upon the judicious selection of the set of parameters to be considered for design as well as to be observed subsequently. The notion of signatures is introduced, and their ability to predict design accuracy is analyzed. The application is demonstrated for an RF LNA circuit.
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https://hal.archives-ouvertes.fr/hal-01142581
Contributeur : Lucie Torella <>
Soumis le : mercredi 15 avril 2015 - 15:08:11
Dernière modification le : jeudi 17 mai 2018 - 13:30:06

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CNRS | TIMA | UGA

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M. Barragan, G. Leger. A Procedure for Alternate Test Feature Design and Selection. IEEE Design & Test, IEEE, 2015, 32 (1), pp.18-25. ⟨10.1109/MDAT.2014.2361722⟩. ⟨hal-01142581⟩

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