A Procedure for Alternate Test Feature Design and Selection

Manuel J. Barragan (1) , G. Leger (2)

1 TIMA - Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés
2 IMSE-CNM - Instituto de Microelectrónica de Sevilla

This paper is a practical illustration of the adoption of alternate tests based upon the judicious selection of the set of parameters to be considered for design as well as to be observed subsequently. The notion of signatures is introduced, and their ability to predict design accuracy is analyzed. The application is demonstrated for an RF LNA circuit.

Domaines: Micro et nanotechnologies/Microélectronique

Manuel J. Barragan, G. Leger. A Procedure for Alternate Test Feature Design and Selection. IEEE Design & Test, 2015, 32 (1), pp.18-25. ⟨10.1109/MDAT.2014.2361722⟩. ⟨hal-01142581⟩