Contact voltage analysis for degraded contact surface by power arcing phenomenon.

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https://hal.archives-ouvertes.fr/hal-01117698
Contributor : Elsa Yee Kin Choi <>
Submitted on : Tuesday, February 17, 2015 - 3:45:55 PM
Last modification on : Thursday, July 19, 2018 - 9:58:01 AM

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  • HAL Id : hal-01117698, version 1

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Elsa Yee Kin Choi, Erwann Carvou, Christine Bourda, Alexandre Vassa, Noureddine Ben Jemaa, et al.. Contact voltage analysis for degraded contact surface by power arcing phenomenon.. 60th IEEE Holm Conference on electrical contacts, Oct 2014, New Orleans, United States. ⟨hal-01117698⟩

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