Measurement of thermal conductance of La0.7Sr0.3MnO3 thin films deposited on SrTiO3 and MgO substrates - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Applied Surface Science Année : 2015

Measurement of thermal conductance of La0.7Sr0.3MnO3 thin films deposited on SrTiO3 and MgO substrates

Résumé

We present measurements of the thermal conductance of thin-film-on-substrate structures that could serve as thin film uncooled bolometers. Studied samples were 75 nm thick epitaxial La 0.7 Sr 0.3 MnO 3 thin films deposited on SrTiO 3 (0 0 1) and MgO (0 0 1) substrates patterned in square geometries of areas ranging from 50 µm × 50 µm to 200 µm × 200 µm. The model allows estimating thermal boundary con-ductance values at the interface between film and substrate of 0.28 ± 0.08 × 10 6 W K −1 m −2 for LSMO/STO (0 0 1) and 5.8 ± 3.0 × 10 6 W K −1 m −2 for LSMO/MgO (0 0 1) from measurements performed in the static regime. Analytical expressions of thermal conductance and thermal capacitance versus modulation fre-quency are compared to measurements of the elevation temperature due to absorbed incoming optical power. The overall good agreement found between measurements and model finally provides the pos-sibility to calculate the bolometric response of thin film bolometers, thus predicting their frequency response for various geometries.
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hal-01108530 , version 1 (23-01-2015)

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Paternité - Pas de modifications

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Ammar Aryan, Bruno Guillet, Jean-Marc Routoure, Cédric Fur, Pierre Langlois, et al.. Measurement of thermal conductance of La0.7Sr0.3MnO3 thin films deposited on SrTiO3 and MgO substrates. Applied Surface Science, 2015, 326, pp.204 - 210. ⟨10.1016/j.apsusc.2014.11.119⟩. ⟨hal-01108530⟩
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