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Article Dans Une Revue Journal of Physical Chemistry Letters Année : 2014

X-ray Photoelectron Spectroscopy of Isolated Nanoparticles

Christophe Nicolas
  • Fonction : Auteur
  • PersonId : 759783
  • IdRef : 075098865
Damien Aureau
Minna Patanen
Xiaojing Liu
Jean-Luc Le Garrec
Emmanuel Robert
Flory-Anne Barreda
  • Fonction : Auteur
  • PersonId : 769614
  • IdRef : 172767628
Arnaud Etcheberry
Catalin Miron

Résumé

X-ray photoelectron spectroscopy (XPS) is a very efficient and still progressing surface analysis technique. However, when applied to nano-objects, this technique faces drawbacks due to interactions with the substrate and sample charging effects. We present a new experimental approach to XPS based on coupling soft X-ray synchrotron radiation with an in-vacuum beam of free nanoparticles, focused by an aerodynamic lens system. The structure of the Si/SiO2 interface was probed without any substrate interaction or charging effects for silicon nanocrystals previously oxidized in ambient air. Complete characterization of the surface was obtained. The Si 2p core level spectrum reveals a nonabrupt interface.

Dates et versions

hal-01080959 , version 1 (06-11-2014)

Identifiants

Citer

Olivier Sublemontier, Christophe Nicolas, Damien Aureau, Minna Patanen, Harold Kintz, et al.. X-ray Photoelectron Spectroscopy of Isolated Nanoparticles. Journal of Physical Chemistry Letters, 2014, 5 (19), pp.3399-3403. ⟨10.1021/jz501532c⟩. ⟨hal-01080959⟩
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