Virtual dark-field images reconstructed from electron diffraction patterns

E.F. Rauch (1) , M. Veron (1)

1 SIMaP - Science et Ingénierie des Matériaux et Procédés

Bright- and dark-field images are reconstructed by extracting the intensities of selected spots from a succession of digitalized electron diffraction patterns collected using a transmission electron microscope by scanning the focused beam over the area of interest. The procedure is similar to the generation of the scanning-transmission electron microscopy images. Several examples are shown to illustrate the flexibility and potentiality of such numerical off-line reconstruction

Domaines: Matériaux

E.F. Rauch, M. Veron. Virtual dark-field images reconstructed from electron diffraction patterns. European Physical Journal: Applied Physics, 2014, 66 (1), ⟨10.1051/epjap/2014130556⟩. ⟨hal-01071861⟩