Susceptibility Analysis of an Operational Amplifier Using On-Chip Measurement

He Huang (1) , Alexandre Boyer (1) , Sonia Ben Dhia (1) , Bertrand Vrignon (2)

1 LAAS-ESE - Équipe Énergie et Systèmes Embarqués
2 Freescale Semiconductor

This paper presents an electromagnetic immunity study of a simple operational amplifier by using the on-chip measurement. With the technology of on-chip non-invasive sensor, the internal inaccessible signal (voltage/current) can be obtained accurately in time domain. This approach grants a good insight in the internal transient response caused by the external electromagnetic interference. The validity of the on-chip measurement results is discussed comparing with the off-chip measurement and simulation.

Mots clés: integrated circuit; on-chip measurement; conducted susceptibility

Domaines: Electronique

He Huang, Alexandre Boyer, Sonia Ben Dhia, Bertrand Vrignon. Susceptibility Analysis of an Operational Amplifier Using On-Chip Measurement. EMC Europe 2014, Sep 2014, Goteborg, Sweden. pp.1-5. ⟨hal-01068127⟩