Service interruption on Monday 11 July from 12:30 to 13:00: all the sites of the CCSD (HAL, Epiciences, SciencesConf, AureHAL) will be inaccessible (network hardware connection).
Skip to Main content Skip to Navigation
Journal articles

Investigation of the thermal properties of thin solid materials at different temperature levels using a set of microresistors

Complete list of metadata

https://hal.archives-ouvertes.fr/hal-01019637
Contributor : Laboratoire CETHIL Connect in order to contact the contributor
Submitted on : Monday, July 7, 2014 - 11:53:05 AM
Last modification on : Monday, February 21, 2022 - 3:38:10 PM

Identifiers

Citation

Ali Assy, Séverine Gomès, Patrice Chantrenne, Nicolas Pavy, Jayalakshmi Parasuraman, et al.. Investigation of the thermal properties of thin solid materials at different temperature levels using a set of microresistors. Microelectronics Journal, Elsevier, 2014, 45 (5), p. 508-514. ⟨10.1016/j.mejo.2013.08.006⟩. ⟨hal-01019637⟩

Share

Metrics

Record views

65