Inelastic x-ray scattering from valence electrons near absorption edges of FeTe and TiSe2

Bernardo Barbiellini , J. N. Hancock (1) , C. Monney (2) , Yves Joly (3) , G. Ghiringhelli (4) , L. Braicovich (4) , T. Schmitt (5)

1 UCONN - University of Connecticut
2 FHI - Fritz-Haber-Institut der Max-Planck-Gesellschaft
3 NEEL - SIN - Surfaces, Interfaces et Nanostructures
4 CNR/SPIN and Dipartimento di Fisica
5 PSI - Paul Scherrer Institute

We study resonant inelastic x-ray scattering (RIXS) peaks corresponding to low-energy particle-hole excited states of metallic FeTe and semimetallic TiSe2 for photon incident energy tuned near the L3 absorption edge of Fe and Ti, respectively. We show that the cross-section amplitudes are well described within a renormalization-group theory where the effect of the core electrons is captured by effective dielectric functions expressed in terms of the the atomic scattering parameters f1 of Fe and Ti. This method can be used to extract the dynamical structure factor from experimental RIXS spectra in metallic systems.

Mots clés: RIXS; FeTe; TiSe2

Domaines: Science des matériaux [cond-mat.mtrl-sci]

Bernardo Barbiellini, J. N. Hancock, C. Monney, Yves Joly, G. Ghiringhelli, et al.. Inelastic x-ray scattering from valence electrons near absorption edges of FeTe and TiSe2. Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2014, 89 (23), pp.235138. ⟨10.1103/PhysRevB.89.235138⟩. ⟨hal-01016739⟩