A Three level strategy for fault detection and diagnosis in industrial processes

Thierry Cecchin (1) , José Ragot (2) , Dominique Sauter (1)

1 CRAN - Centre de Recherche en Automatique de Nancy
2 CID

Having proved the importance of detection and diagnosis of faults that may affect an industrial installation, the authors propose a strategy for the diagnosis of working state applicable to all the processes represented by deterministic models. This strategy is applied tu supervise a mineralurgical circuit.

Domaines: Automatique

Thierry Cecchin, José Ragot, Dominique Sauter. A Three level strategy for fault detection and diagnosis in industrial processes. S.G. Tzafestas, Madan Singh, Günther Schmidt. System Fault Diagnostics, Reliability and Related Knowledge-Based Approaches, Springer, pp.219-233, 1987, Fault Diagnostics and Reliability. ⟨hal-01010595⟩