Accurate index profile measurements for fiber bragg gratings and sensor application

Xavier Chapeleau (1) , Dominique Leduc (2) , Pascal Casari (2) , Yves Quinquempois (3) , Josselin Lebon (2) , Francisco Lopez (3) , Cyril Lupi (2) , Christian Boisrobert (1)

1 IREENA - Institut de Recherche en Energie Electrique de Nantes Atlantique EA4642
2 GeM - Institut de Recherche en Génie Civil et Mécanique
3 PhLAM - Laboratoire de Physique des Lasers, Atomes et Molécules - UMR 8523

This paper demonstrates that the combination of the optical low-coherence reflectometry and the layer-peeling algorithm is a suitable method to measure the index profile of fiber Bragg gratings. The high sensitivity of this technique permits to detect index modulation amplitude as small as $10^{-5}$. The phase of the grating can also be determined accurately and we demonstrate that this measurement permits to retrieve the axial strain distribution for gratings subjected to strain gradient.

Mots clés: Reflectometry; Optical variables control; Phase modulation; Optical scattering; Optical sensors; Optical refraction; Optical modulation; Amplitude modulation; Fiber gratings; Bragg gratings

Domaines: Mécanique [physics.med-ph]; Matériaux

Xavier Chapeleau, Dominique Leduc, Pascal Casari, Yves Quinquempois, Josselin Lebon, et al.. Accurate index profile measurements for fiber bragg gratings and sensor application. Symposium on Optical Fiber Measurements, 2004, Boulder, United States. ⟨10.1109/SOFM.2004.183503⟩. ⟨hal-01007832⟩