Depth-resolved magnetization distribution in ultra thin films by soft X-ray resonant magnetic reflectivity

Jean-Marc Tonnerre (1) , Emmanuelle Jal (1) , Elsa Bontempi (2) , Nicolas Jaouen (3) , Marta Elzo (1) , Stéphane Grenier (4) , Holger Meyerheim (5) , Marek Przybylski (5)

1 NEEL - SIN - Surfaces, Interfaces et Nanostructures
2 Laboratorio di Chimica per la Tecnologie
3 SSOLEIL - Synchrotron SOLEIL
4 NEEL - MRS - Matériaux, Rayonnements, Structure
5 MPI-HALLE - Max-Planck-Institut für Mikrostrukturphysik

Domaines: Physique [physics]

Jean-Marc Tonnerre, Emmanuelle Jal, Elsa Bontempi, Nicolas Jaouen, Marta Elzo, et al.. Depth-resolved magnetization distribution in ultra thin films by soft X-ray resonant magnetic reflectivity. The European Physical Journal. Special Topics, 2012, 208 (1), pp.177. ⟨10.1140/epjst/e2012-01618-y⟩. ⟨hal-01002268⟩