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New parameter extraction method based on split C-V measurements in FDSOI MOSFETs

Résumé : Vol. 84, pp., doi:(June 2013)
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https://hal.archives-ouvertes.fr/hal-01002112
Contributor : Brigitte Rasolofoniaina <>
Submitted on : Thursday, June 5, 2014 - 3:47:43 PM
Last modification on : Monday, July 20, 2020 - 9:12:05 AM

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I. Ben Akkez, A. Cros, C. Fenouillet-Beranger, F. Boeuf, Q. Rafhay, et al.. New parameter extraction method based on split C-V measurements in FDSOI MOSFETs. Solid-State Electronics, Elsevier, 2013, 84, pp.142-146. ⟨10.1016/j.sse.2013.02.011⟩. ⟨hal-01002112⟩

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