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Impact of local back biasing on performance in hybrid FDSOI/bulk high-k/metal gate low power (LP) technology

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https://hal.archives-ouvertes.fr/hal-01002051
Contributor : Brigitte Rasolofoniaina <>
Submitted on : Thursday, June 5, 2014 - 2:21:46 PM
Last modification on : Wednesday, July 21, 2021 - 2:56:55 PM

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C. Fenouillet-Beranger, P. Perreau, T. Benoist, C. Richier, S. Haendler, et al.. Impact of local back biasing on performance in hybrid FDSOI/bulk high-k/metal gate low power (LP) technology. Solid-State Electronics, Elsevier, 2013, 88, pp.15-20,. ⟨10.1016/j.sse.2013.04.008⟩. ⟨hal-01002051⟩

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