Experimental verification of negative refraction for a wedge-type negative index metamaterial operating at terahertz - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Applied Physics Letters Année : 2010

Experimental verification of negative refraction for a wedge-type negative index metamaterial operating at terahertz

Résumé

We report on angle-resolved time domain spectroscopy TDS carried out on a prismlike negative index metamaterial operating around 0.5 THz. The wedge-type devices are constituted of hole arrays etched in gold thin films, which are stacked according to a sequential mask shift. By means of a goniometric TDS setup and subsequent analysis of the temporal waveforms, negative refraction is demonstrated with values close to n=−1 around 0.5 THz. The dispersion of refractive index retrieved from the Snell–Descartes law shows comparable trends in comparison with the dispersion deduced from complex transmission and reflection measurements on slab-type samples
Fichier principal
Vignette du fichier
Wang_2010_1.3511540.pdf (1001.01 Ko) Télécharger le fichier
Origine : Fichiers éditeurs autorisés sur une archive ouverte

Dates et versions

hal-00991478 , version 1 (27-05-2022)

Identifiants

Citer

Shengxiang Wang, Frédéric Garet, Karine Blary, Eric Lheurette, Jean-Louis Coutaz, et al.. Experimental verification of negative refraction for a wedge-type negative index metamaterial operating at terahertz. Applied Physics Letters, 2010, 97, pp.181902. ⟨10.1063/1.3511540⟩. ⟨hal-00991478⟩
79 Consultations
33 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More