Signal propagation analysis by digital lock-in time resolved imaging

G. Bascoul (1) , Philippe Perdu (1) , D. Lewis (2)

1 CNES - Centre National d'Études Spatiales [Toulouse]
2 IMS - Laboratoire de l'intégration, du matériau au système

Time Resolved Imaging (TRI) allows real time imaging of transitions in CMOS gates. This technique has been validated down to low power 45 nm technology. TRI is very useful to analyze signal propagation after a clock edge. Nevertheless, TRI dimensional (x, y, t) data are not well adapted for direct visualization of propagation times: (x, y, t) data allows either a movie output or a slice by slice visualization for each time step or a chosen spot chronograms. To overcome these limitations, we have developed and validated a new signal propagation analysis technique by Digital Lock-in Time Resolved Imaging. It gives a 2D image of propagation time that can be used for accurate analysis of signal propagation

Domaines: Electronique

G. Bascoul, Philippe Perdu, D. Lewis. Signal propagation analysis by digital lock-in time resolved imaging. 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2012, Jul 2012, Singapour, Singapore. pp.1-5. ⟨hal-00988346⟩