Skip to Main content Skip to Navigation
Conference papers

Techniques and Prospects for Fault-tolerance in Post-CMOS ULSI

Yangyang Tang 1, 2 Sundararajan Gopalakrishnan 2 Chris Winstead 2 Emmanuel Boutillon 1 Christophe Jego 3 Michel Jezequel 4
3 Conception/CSN
IMS - Laboratoire de l'intégration, du matériau au système
Lab-STICC - Laboratoire des sciences et techniques de l'information, de la communication et de la connaissance
Abstract : This paper presents a survey of fault-masking techniques suitable for tolerating short-duration transient upsets in minimum-scale switching devices. Two types of fault masking are considered. The first type, coded dual-modular redundancy (cDMR), represents a family of parity-checking methods suitable for correcting a low rate of transient upsets. The second type, Restorative Feedback (RFB), is a triple-modular solution suitable for compensating a higher rate of transient upsets. We show that cDMR can be used efficiently for crossbar-style logic, but is not efficient in general for all logic styles. By contrast, RFB offers a fixed redundancy, and can be applied in general to any logic circuit. Finally, we propose novel circuits for ternary Muller C implementation based on carbon nanotube FET devices.
Document type :
Conference papers
Complete list of metadatas

Cited literature [28 references]  Display  Hide  Download
Contributor : Christophe Jego <>
Submitted on : Wednesday, March 5, 2014 - 6:16:52 PM
Last modification on : Wednesday, June 24, 2020 - 4:19:28 PM
Long-term archiving on: : Thursday, June 5, 2014 - 11:05:46 AM


Files produced by the author(s)


  • HAL Id : hal-00955755, version 1


Yangyang Tang, Sundararajan Gopalakrishnan, Chris Winstead, Emmanuel Boutillon, Christophe Jego, et al.. Techniques and Prospects for Fault-tolerance in Post-CMOS ULSI. ULSIWS 2012: 21st International Workshop on Post-Binary ULSI Systems, May 2012, France. pp.1-7. ⟨hal-00955755⟩



Record views


Files downloads