EPC Class 1 GEN 2 UHF RFID tag emulator for robustness evaluation and improvement

Omar Abdelmalek (1) , David Hely (1) , Vincent Beroulle (2)

1 LCIS - Laboratoire de Conception et d'Intégration des Systèmes
2 CTSYS - Conception et Test de SYStèmes embarqués

RFID ICs such as EPC Class 1 GEN2 tag are low cost tags which are in some cases used for critical or secure applications. Increasing their robustness is not trivial due to the wide range of error sinks (EM perturbations, attacks...). Moreover increasing the robustness must have a minimum impact on the die area but also must fit with a standardized protocol. In this work we propose a design methodology in order to develop hardened digital tag architecture with a dedicated verification environment taking into account all RFID system parameters

Mots clés: Fault Injection; robustness evaluation; RFID

Domaines: Micro et nanotechnologies/Microélectronique

Omar Abdelmalek, David Hely, Vincent Beroulle. EPC Class 1 GEN 2 UHF RFID tag emulator for robustness evaluation and improvement. Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2013 8th International Conference on, Mar 2013, Marrakesh, Morocco. pp.20-24, ⟨10.1109/DTIS.2013.6527771⟩. ⟨hal-00950128⟩