Nanometric resolution using far-field optical tomographic microscopy in the multiple scattering regime

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Submitted on : Thursday, February 6, 2014 - 2:43:12 PM
Last modification on : Monday, March 4, 2019 - 2:04:24 PM

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Jules Girard, Guillaume Maire, Hugues Giovannini, Anne Talneau, Kamal Belkebir, et al.. Nanometric resolution using far-field optical tomographic microscopy in the multiple scattering regime. Physical Review A, American Physical Society, 2010, 82, pp.061801. ⟨hal-00942796⟩

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