V. Chamard, J. Stangl, G. Carbone, A. Diaz, G. Chen et al., Three-Dimensional X-Ray Fourier Transform Holography: The Bragg Case, Physical Review Letters, vol.104, issue.16, p.165501, 2010.
DOI : 10.1103/PhysRevLett.104.165501
URL : https://hal.archives-ouvertes.fr/hal-01254111

R. W. Gerchberg and W. O. Saxton, A practical algorithm for the determination of the phase from image and diffraction plane pictures, Optik, vol.35, pp.237-246, 1972.

J. R. Fienup, Phase retrieval algorithms: a comparison, Applied Optics, vol.21, issue.15, pp.2758-2769, 1982.
DOI : 10.1364/AO.21.002758

S. Marchesini, H. He, H. N. Chapman, S. P. Hau-riege, A. Noy et al., X-ray image reconstruction from a diffraction pattern alone, Physical Review B, vol.68, issue.14, p.140101, 2003.
DOI : 10.1103/PhysRevB.68.140101

S. Takagi, A Dynamical Theory of Diffraction for a Distorted Crystal, Journal of the Physical Society of Japan, vol.26, issue.5, pp.1239-1253, 1969.
DOI : 10.1143/JPSJ.26.1239

A. Snigirev, V. Kohn, I. Snigireva, A. Souvorov, and B. Lengeler, Focusing high-energy x rays by compound refractive lenses, Applied Optics, vol.37, issue.4, pp.653-662, 1998.
DOI : 10.1364/AO.37.000653

K. Yamauchi, H. M. Mimura, K. Yamamura, Y. Sano, H. Yumoto et al., Development of Elliptical Kirkpatrick-Baez Mirrors for Hard X-ray Nanofocusing, Frontiers in Optics, 2005.
DOI : 10.1364/FIO.2005.FTuS4

D. M. Paganin, Coherent X-ray Optics, Oxford series on synchrotron radiation, 2006.

W. Chao, B. D. Harteneck, J. A. Liddle, E. H. Anderson, and D. T. Attwood, Soft X-ray microscopy at a spatial resolution better than 15???nm, Nature, vol.10, issue.7, pp.1210-1213, 2005.
DOI : 10.1126/science.1088654

E. D. Fabrizio, F. Romanato, M. Gentili, S. Cabrini, B. Kaulich et al., High-efficiency multilevel zone plates for keV x-rays, Nature, vol.401, issue.6756, pp.895-898, 1999.
DOI : 10.1038/44791

C. G. Schroer, P. Boye, J. M. Feldkamp, J. Patommel, A. Schropp et al., Coherent X-Ray Diffraction Imaging with Nanofocused Illumination, Physical Review Letters, vol.101, issue.9, p.90801, 2008.
DOI : 10.1103/PhysRevLett.101.090801

I. A. Vartanyants and I. K. Robinson, Partial coherence effects on the imaging of small crystals using coherent x-ray diffraction, Journal of Physics: Condensed Matter, vol.13, issue.47, pp.10593-10611, 2001.
DOI : 10.1088/0953-8984/13/47/305

A. Diaz, C. Mocuta, J. Stangl, B. Mandl, C. David et al., Coherent diffraction imaging of a single epitaxial InAs nanowire using a focused x-ray beam, Physical Review B, vol.79, issue.12, p.125324, 2009.
DOI : 10.1103/PhysRevB.79.125324
URL : https://hal.archives-ouvertes.fr/hal-01254099

G. J. Williams, H. M. Quiney, B. B. Dhal, C. Q. Tran, K. A. Nugent et al., Fresnel Coherent Diffractive Imaging, Physical Review Letters, vol.97, issue.2, p.25506, 2006.
DOI : 10.1103/PhysRevLett.97.025506

K. A. Nugent, A. G. Peele, H. M. Quiney, and H. N. Chapman, Diffraction with wavefront curvature: a path to unique phase recovery, Acta Crystallographica Section A Foundations of Crystallography, vol.61, issue.3, pp.373-381, 2005.
DOI : 10.1107/S010876730501055X

V. Chamard, A. Diaz, J. Stangl, and S. Labat, Structural investigation of InAs nanowires with coherent X-rays, The Journal of Strain Analysis for Engineering Design, vol.76, issue.7, pp.533-542, 2009.
DOI : 10.1243/03093247JSA573
URL : https://hal.archives-ouvertes.fr/hal-01253296

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David et al., High-Resolution Scanning X-ray Diffraction Microscopy, Science, vol.321, issue.5887, pp.379-382, 2008.
DOI : 10.1126/science.1158573

C. M. Kewish, P. Thibault, M. Dierolf, O. Bunk, A. Menzel et al., Ptychographic characterization of the wavefield in the focus of reflective hard X-ray optics, Ultramicroscopy, vol.110, issue.4, pp.325-329, 2010.
DOI : 10.1016/j.ultramic.2010.01.004

H. M. Quiney, A. G. Peele, Z. Cai, D. Paterson, and K. A. Nugent, Diffractive imaging of highly focused X-ray fields, Nature Physics, vol.70, issue.2, pp.101-104, 2006.
DOI : 10.1038/nphys218

A. Diaz, C. Mocuta, J. Stangl, M. Keplinger, T. Weitkamp et al., Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometry, Journal of Synchrotron Radiation, vol.78, issue.3, pp.299-307, 2010.
DOI : 10.1107/S0909049510004644

S. Gorelick, J. Vila-comamala, V. A. Guzenko, R. Barrett, M. Salomé et al., High-efficiency Fresnel zone plates for hard X-rays by 100???keV e-beam lithography and electroplating, Journal of Synchrotron Radiation, vol.109, issue.3, pp.442-446, 2011.
DOI : 10.1107/S0909049511002366

C. David, B. Nöhammer, E. Ziegler, and O. Hignette, Tunable diffractive optical elements for hard x-rays, Proc. SPIE 4499, pp.96-104, 2001.

C. Ponchut, J. M. Rigal, J. Clément, E. Papillon, A. Homs et al., MAXIPIX, a fast readout photon-counting X-ray area detector for synchrotron applications, Journal of Instrumentation, vol.6, issue.01, p.1069, 2011.
DOI : 10.1088/1748-0221/6/01/C01069

J. Vila-comamala, S. Gorelick, E. Färm, C. M. Kewish, A. Diaz et al., Ultra-high resolution zone-doubled ???diffractive X-ray optics for the multi-keV regime, Optics Express, vol.19, issue.1, pp.175-184, 2011.
DOI : 10.1364/OE.19.000175

O. Bunk, A. Diaz, F. Pfeiffer, C. David, B. Schmitt et al., Diffractive imaging for periodic samples: retrieving one-dimensional concentration profiles across microfluidic channels, Acta Crystallographica Section A Foundations of Crystallography, vol.63, issue.4, pp.306-314, 2007.
DOI : 10.1107/S0108767307021903

D. L. Bolloc-'h, F. Livet, F. Bley, T. Schülli, M. Veron et al., X-ray diffraction from rectangular slits, Journal of Synchrotron Radiation, vol.9, issue.4, pp.258-265, 2002.
DOI : 10.1107/S0909049502005708