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Comparison between TCAD simulated and measured carrier lifetimes in CMOS photodiodes using the Open Circuit Voltage Decay method

Abstract : The control and prediction of minority carrier lifetime are crucial for the design of photodiodes, especially for CMOS image sensors, because signal electrons must be captured before recombination. Analytic models have been developed but do not allow accurate and reliable lifetime estimations according to complex photodiode architecture. In this work, we show for the first time that mixed-mode TCAD simulations produce accurate and reliable results for realistic photodiode designs. To arrive at this conclusion, we have performed measurements and simulations on two different photodiodes using the Open Circuit Voltage Decay method.
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https://hal.archives-ouvertes.fr/hal-00935974
Contributor : Open Archive Toulouse Archive Ouverte (oatao) <>
Submitted on : Friday, January 24, 2014 - 11:57:18 AM
Last modification on : Tuesday, July 23, 2019 - 11:28:05 AM
Long-term archiving on: : Saturday, April 8, 2017 - 11:30:25 PM

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Olivier Marcelot, Pierre Magnan. Comparison between TCAD simulated and measured carrier lifetimes in CMOS photodiodes using the Open Circuit Voltage Decay method. Solid-State Electronics, Elsevier, 2013, vol. 81, pp. 135-139. ⟨10.1016/j.sse.2012.11.005⟩. ⟨hal-00935974⟩

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