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Broadband nanodielectric spectroscopy by means of amplitude modulation electrostatic force microscopy (AM-EFM)

Abstract : In this work we present a new AFM based approach to measure the local dielectric response of polymer films at the nanoscale by means of Amplitude Modulation Electrostatic Force Microscopy (AM-EFM). The proposed experimental method is based on the measurement of the tip-sample force via the detection of the second harmonic component of the photosensor signal by means of a lock-in amplifier. This approach allows reaching unprecedented broad frequency range (2-3×104 Hz) without restrictions on the sample environment. The method was tested on different poly(vinyl acetate) (PVAc) films at several temperatures. Simple analytical models for describing the electric tip-sample interaction semi-quantitatively account for the dependence of the measured local dielectric response on samples with different thicknesses and at several tip-sample distances.
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https://hal.archives-ouvertes.fr/hal-00933984
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Gustavo Ariel Schwartz, Clément Riedel, Richard Arinero, Philippe Tordjeman, Angel Alegría, et al.. Broadband nanodielectric spectroscopy by means of amplitude modulation electrostatic force microscopy (AM-EFM). Ultramicroscopy, Elsevier, 2011, vol. 111, pp. 1366-1369. ⟨10.1016/j.ultramic.2011.05.001⟩. ⟨hal-00933984⟩

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