Combined coherent x-ray micro-diffraction and local mechanical loading on copper nanocrystals

G. Beutier (1) , M. Verdier (1) , M. de Boissieu (1) , B. Gilles (1) , F. Livet (1) , M.-I. Richard (2, 3) , T. W. Cornelius (2, 3) , S. Labat (2) , O. Thomas (2)

1 SIMaP - Science et Ingénierie des Matériaux et Procédés
2 IM2NP - Institut des Matériaux, de Microélectronique et des Nanosciences de Provence
3 ESRF - European Synchrotron Radiation Facility

Coherent x-ray micro-diffraction and local mechanical loading can be combined to investigate the mechanical deformation in crystalline nanostructures. Here we present measurements of plastic deformation in a copper crystal of sub-micron size obtained by loading the sample with an Atomic Force Microscopy tip. The appearance of sharp features in the diffraction pattern, while conserving its global shape, is attributed to crystal defects induced by the tip.

Domaines: Science des matériaux [cond-mat.mtrl-sci]; Matériaux

G. Beutier, M. Verdier, M. de Boissieu, B. Gilles, F. Livet, et al.. Combined coherent x-ray micro-diffraction and local mechanical loading on copper nanocrystals. Journal of Physics: Conference Series, 2013, 425, pp.132003. ⟨10.1088/1742-6596/425/13/132003⟩. ⟨hal-00827931⟩