Durability study of a fluorescent optical memory in glass studied by luminescence spectroscopy

Arnaud Royon (1, 2) , Kevin Bourhis (3) , Laurent Béchou (1) , Thierry Cardinal (3) , Lionel Canioni (1) , Yannick Deshayes (2)

1 LOMA - Laboratoire Ondes et Matière d'Aquitaine
2 IMS - Laboratoire de l'intégration, du matériau au système
3 ICMCB - Institut de Chimie de la Matière Condensée de Bordeaux

Thermal stress at 100 °C for more than 3168 h of a fluorescent optical memory composed of laser written silver nano clusters embedded in glass has been performed. Measurements of luminescence spectra have been carried out at different times, showing a decreasing and an increasing evolution of the red and the blue part of the spectrum, respectively. This evolution has been attributed to the diffusion and the reorganization of different silver species inside the matrix, altering the internal electric field. Stark effect based modeling enables the degradation mode of the memory.

Mots clés: Relability; femtosecond laser; data storage; optical memory

Domaines: Optique [physics.optics]

Arnaud Royon, Kevin Bourhis, Laurent Béchou, Thierry Cardinal, Lionel Canioni, et al.. Durability study of a fluorescent optical memory in glass studied by luminescence spectroscopy. Microelectronics Reliability, 2013, 53 (9-11), pp.1514-1518. ⟨10.1016/j.microrel.2013.07.110⟩. ⟨hal-00932228⟩