Effect of speckle on APSCI method and Mueller Imaging

Debajyoti Upadhyay (1) , Michael Richert (1) , Eric Lacot (2) , Antonello de Martino (3) , Xavier Orlik (4)

1 ONERA - The French Aerospace Lab [Châtillon]
2 LSP - Laboratoire de Spectrométrie Physique
3 LPICM - Laboratoire de physique des interfaces et des couches minces [Palaiseau]
4 ONERA - The French Aerospace Lab [Toulouse]

The principle of the polarimetric imaging method called APSCI (Adapted Polarization State Contrast Imaging) is to maximize the polarimetric contrast between an object and its background using specific polarization states of illumination and detection. We perform here a comparative study of the APSCI method with existing Classical Mueller Imaging(CMI) associated with polar decomposition in the presence of fully and partially polarized circular Gaussian speckle. The results show a noticeable increase of the Bhattacharyya distance used as our contrast parameter for the APSCI method, especially when the object and background exhibit several polarimetric properties simultaneously.

Mots clés: Polarimetry; (260.5430) Polarization; (110.5405) Polarimetric imaging; (110.2970) Image detection system

Domaines: Optique [physics.optics]

Debajyoti Upadhyay, Michael Richert, Eric Lacot, Antonello de Martino, Xavier Orlik. Effect of speckle on APSCI method and Mueller Imaging. Optics Express, 2012, 19 (5), pp.4553-4559. ⟨10.1364/OE.19.004553⟩. ⟨hal-00925277⟩