New EW Electromigration validation via node vector method " from Reliability Physics Symposium (IRPS), 2010. ,
DOI : 10.1109/irps.2010.5488746
WiT Optimal Wiring Topology for Electromigration avoidance " from VLSI, 2011. ,
A comprehensive TCAD Approch for Assessing Electromigration reliability of modern Interconnects " from Device and Materials Reliability, 2009. ,
Refueling: Preventing Wire Degradation due to Electromigration, IEEE Micro, vol.28, issue.6, 2008. ,
DOI : 10.1109/MM.2008.92
Method for managing electromigration in SOC's when designing for both reliability and manufacturing " from SOC conference, 2006. ,
Electromigration Failure Mechanism and Lifetime Expectation for Bi-Modal Distribution in Cu/Low-k Interconnect " from International Interconnect Technology Conference, 2007. ,
Design tools for reliability analysis, Proceedings of the 43rd annual conference on Design automation , DAC '06, 2006. ,
DOI : 10.1145/1146909.1146960