Using BEEM (Ballistic Electron Emission Microscopy) to probe buried interfaces in metal-organic monolayer-semiconductor hybrid heterostructures

Alexandra Junay (1) , Sophie Guézo (1) , Francine Solal (1) , Soraya Ababou-Girard (1) , Pascal Turban (1) , Gabriel Delhaye (1) , Sylvain Tricot (1) , Cristelle Meriadec (1)

1 IPR - Institut de Physique de Rennes

Domaines: Science des matériaux [cond-mat.mtrl-sci]

Alexandra Junay, Sophie Guézo, Francine Solal, Soraya Ababou-Girard, Pascal Turban, et al.. Using BEEM (Ballistic Electron Emission Microscopy) to probe buried interfaces in metal-organic monolayer-semiconductor hybrid heterostructures. International Conference on Nanoscience and Technology (ICN+T 2013), Sep 2013, Paris, France. ⟨hal-00881462⟩