Study of temperature and radiation induced microstructural changes in Xe-implanted UO2 by TEM, STEM, SIMS and positron spectroscopy

Nikolay Djourelov , Benoît Marchand (1) , Hristo Marinov , Nathalie Moncoffre (1) , Yves Pipon (1) , Nicolas Bérerd (1) , Patrick Nédélec (2) , Louis Raimbault (3, 4) , Thierry Epicier (5)

1 ACE
2 IPNL - Institut de Physique Nucléaire de Lyon
3 LPS - Laboratoire Pierre Süe
4 GEOSCIENCES - Centre de Géosciences
5 MATEIS - Matériaux, ingénierie et science [Villeurbanne]

Mots clés: uranium dioxide; xenon; SIMS; positron spectroscopy

Domaines: Science des matériaux [cond-mat.mtrl-sci]

Nikolay Djourelov, Benoît Marchand, Hristo Marinov, Nathalie Moncoffre, Yves Pipon, et al.. Study of temperature and radiation induced microstructural changes in Xe-implanted UO2 by TEM, STEM, SIMS and positron spectroscopy. Journal of Nuclear Materials, 2013, 443 (1-3), pp.562-569. ⟨10.1016/j.nucmat.2013.07.066⟩. ⟨hal-00881212⟩